Oxide-ion conduction and dielectric relaxation in the fluorite-type Zr0.8Ln0.2O1.9 (Ln Nd, Sm, Eu, Gd, Dy, Ho, Er, Tm, Yb, Lu) system

Publisher： IOP Publishing

ISSN： 1757-899X

Source： IOP Conference Series: Materials Science and Engineering, Vol.18, Iss.13, 2011-06, pp. : 49-52

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