Publisher: IOP Publishing
ISSN: 1757-899X
Source: IOP Conference Series: Materials Science and Engineering, Vol.23, Iss.1, 2011-06, pp. : 129-132
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
TEM Analysis of Planar Defects in InGaAsN and GaAs Grown on Ge (001) by MOVPE
Key Engineering Materials, Vol. 2016, Iss. 675, 2016-02 ,pp. :