Publisher： IOP Publishing
ISSN： 1757-899X
Source： IOP Conference Series: Materials Science and Engineering, Vol.37, Iss.1, 2012-07, pp. : 75-82
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Composition of Kaew Angwa by X-Ray Fluorescence Spectroscopy (XRF)
Key Engineering Materials, Vol. 2016, Iss. 702, 2016-09 ,pp. :
Access to resources
Recommend
Access to resources
Measurement of Multilayer Film Thickness Using X-Ray Fluorescence Spectrometer
Key Engineering Materials, Vol. 2017, Iss. 726, 2017-03 ,pp. :
By Kurochkin Vladimir Kravchenko Larisa Kuz’menko Lyudmila Tsurpal Lyudmila
Powder Metallurgy and Metal Ceramics, Vol. 44, Iss. 3-4, 2005-03 ,pp. :