Electrode dependent interfacial layer variation in metal-oxide-semiconductor capacitor

Publisher: IOP Publishing

ISSN: 1757-899X

Source: IOP Conference Series: Materials Science and Engineering, Vol.54, Iss.1, 2014-03, pp. : 22-26

Access to resources Favorite

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract