Publisher: IOP Publishing
ISSN: 1367-2630
Source: New Journal of Physics, Vol.8, Iss.6, 2006-06, pp. : 255-262
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Sub-Abbe resolution: from STED microscopy to STED lithography
By Klar Thomas A Wollhofen Richard Jacak Jaroslaw
Physica Scripta, Vol. 2014, Iss. 162, 2014-09 ,pp. :
Measuring magnetic correlations in nanoparticle assemblies
Journal of Physics: Conference Series , Vol. 521, Iss. 1, 2014-06 ,pp. :
Advanced electron tomography of nanoparticle assemblies
By Altantzis T. Zanaga D. Bals S.
EPL (EUROPHYSICS LETTERS), Vol. 119, Iss. 3, 2017-10 ,pp. :
Phase filter enhanced STED-4Pi fluorescence microscopy: theory and experiment
New Journal of Physics, Vol. 7, Iss. 1, 2005-05 ,pp. :
The use of azimuthally polarized sinh-Gauss beam in STED microscopy
By Liu Yong Kuang Cuifang Liu Xu
Journal of Optics, Vol. 17, Iss. 4, 2015-04 ,pp. :