![Open access](/images/ico/o.png)
![](/images/ico/ico5.png)
Publisher: IOP Publishing
ISSN: 1367-2630
Source: New Journal of Physics, Vol.11, Iss.10, 2009-10, pp. : 99-109
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Electron Trap Energy Distribution in HfO2 by the Discharge-Based Pulse I–V Technique
Chinese Physics Letters, Vol. 31, Iss. 12, 2014-12 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
New techniques in electron energy-loss spectroscopy and energy-filtered imaging
By Egerton R.F.
Micron, Vol. 34, Iss. 3, 2003-04 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Electron energy-loss spectroscopy (EELS) ; comparison with X-ray analysis
Le Journal de Physique IV, Vol. 03, Iss. C7, 1993-11 ,pp. :