Study of the secondary ion emission by electrons from microchannel plates (MCP)

ISSN： 1742-6596

Source： Journal of Physics: Conference Series , Vol.100, Iss.4, 2008-03, pp. : 49-52

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Theoretical study of secondary ion emission

Journal de Physique, Vol. 30, Iss. 4, 1969-04 ,pp. : 365-376

Edp Sciences

Access to resources Recommend Favorite

Study of the secondary emission of electrons from thick targets subjected to bombardment by 1 MeV protons.

Journal de Physique, Vol. 24, Iss. 6, 1963-06 ,pp. : 374-378

Edp Sciences

Access to resources Recommend Favorite

Use of a gaseous ion gun for the study of secondary emission from a strained metal surface.

Journal de Physique et le Radium, Vol. 19, Iss. 11, 1958-11 ,pp. : 911-912

Edp Sciences

Access to resources Recommend Favorite

UPTAKE, STORAGE AND EXCRETION OF URANIUM BY MYTILUS EDULIS, A STRUCTURAL, ULTRASTRUCTURAL AND MICROANALYTICAL STUDY BY SECONDARY ION EMISSION AND X RAY SPECTROMETRY

Le Journal de Physique Colloques, Vol. 45, Iss. C2, 1984-02 ,pp. : C2-545-C2-548

Edp Sciences

Access to resources Recommend Favorite

Structure effects in secondary ion emission of metals and alloys

By Yurasova V. Cherepin V. Ryzhov Yu.

Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques, Vol. 5, Iss. 3, 2011-06 ,pp. : 465-483

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite