Nanoscale EELS analysis of oxides: composition mapping, valence determination and beam damage

ISSN： 1742-6596

Source： Journal of Physics: Conference Series , Vol.26, Iss.1, 2006-02, pp. : 69-72

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Advantages of low beam energies in a TEM for valence EELS

Journal of Physics: Conference Series , Vol. 209, Iss. 1, 2010-02 ,pp. : 186-189

IOP Publishing

Access to resources Recommend Favorite

Electron beam damage in oxides: a review

By Jiang Nan

Reports on Progress in Physics, Vol. 79, Iss. 1, 2016-01 ,pp. : 16501-16533

IOP Publishing

Access to resources Recommend Favorite

EELS characterisation and valence determination of Mn minerals from the Kalahari manganese field in South Africa

Journal of Physics: Conference Series , Vol. 126, Iss. 1, 2008-08 ,pp. : 186-189

IOP Publishing

Access to resources Recommend Favorite

Nanoscale EELS analysis of elemental distribution and band-gap properties in AlGaN epitaxial layers

Journal of Physics: Conference Series , Vol. 326, Iss. 1, 2011-11 ,pp. : 229-234

IOP Publishing

Access to resources Recommend Favorite

DETERMINATION OF ELECTRON BEAM CHARGING CONDITIONS OF OXIDES AT LOW ENERGY IN THE LOW DOSE RANGE

Le Journal de Physique Colloques, Vol. 50, Iss. C6, 1989-06 ,pp. : C6-174-C6-174

Edp Sciences

Access to resources Recommend Favorite