Publisher: IOP Publishing
ISSN: 1742-6596
Source: Journal of Physics: Conference Series , Vol.241, Iss.1, 2010-07, pp. : 37-40
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Weak-beam dark-field electron tomography of dislocations in GaN
Journal of Physics: Conference Series , Vol. 26, Iss. 1, 2006-02 ,pp. :
DISLOCATIONS IN SEMICONDUCTORS AS STUDIED BY WEAK-BEAM ELECTRON MICROSCOPY
Le Journal de Physique Colloques, Vol. 40, Iss. C6, 1979-06 ,pp. :
THE WEAK-BEAM TECHNIQUE AS APPLIED TO DISSOCIATION MEASUREMENTS
Le Journal de Physique Colloques, Vol. 35, Iss. C7, 1974-12 ,pp. :
On the visibility of "heavy" atoms in dark-field STEM
Journal of Physics: Conference Series , Vol. 371, Iss. 1, 2012-07 ,pp. :
Structured dark-field imaging for single nano-particles
By Jian Chen Kun Gao Zhi-Li Wang Wen-Bing Yun Zi-Yu Wu
Chinese Physics B, Vol. 24, Iss. 8, 2015-08 ,pp. :