Publisher: IOP Publishing
ISSN: 1742-6596
Source: Journal of Physics: Conference Series , Vol.505, Iss.1, 2014-04, pp. : 100-103
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
CVD induced by ion beams for the preparation of oxide and nitride thin films
Le Journal de Physique IV, Vol. 09, Iss. PR8, 1999-09 ,pp. :
Formation of CVD copper films investigated by surface analysis and reflectivity
Le Journal de Physique IV, Vol. 03, Iss. C3, 1993-08 ,pp. :
Characterization of SiO
Le Journal de Physique IV, Vol. 03, Iss. C4, 1993-09 ,pp. :