Crystallinity and in-field characterization of high-Tc YBa2Cu408 and Y0.9Ca0.1Ba2Cu4O8 epitaxial films fabricated by low temperature flux method

Publisher: IOP Publishing

ISSN: 1742-6596

Source: Journal of Physics: Conference Series , Vol.507, Iss.1, 2014-05, pp. : 64-67

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Abstract