Publisher: IOP Publishing
ISSN: 1742-6596
Source: Journal of Physics: Conference Series , Vol.511, Iss.1, 2014-05, pp. : 372-377
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
MORPHOLOGICAL CHARACTERIZATION OF SiC MATERIALS
Le Journal de Physique Colloques, Vol. 47, Iss. C1, 1986-02 ,pp. :
Carbon vacancy in SiC: A negative-
By Bechstedt F. Zywietz A. Furthmüller J.
EPL (EUROPHYSICS LETTERS), Vol. 44, Iss. 3, 2010-03 ,pp. :