Publisher： IOP Publishing
ISSN： 1742-6596
Source： Journal of Physics: Conference Series , Vol.522, Iss.1, 2014-06, pp. : 130-134
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
HIGH RESOLUTION ELECTRON BEAM INJECTION IN SEMICONDUCTORS USING A SCANNING TUNNELING MICROSCOPE
Le Journal de Physique IV, Vol. 01, Iss. C6, 1991-12 ,pp. :
Access to resources
Recommend
ANALYSIS OF FIELD EMITTER SURFACES BY VERY HIGH RESOLUTION AUGER ELECTRON SPECTROSCOPY
Le Journal de Physique Colloques, Vol. 47, Iss. C7, 1986-11 ,pp. :
STEM electron tomography in the Scanning Electron Microscope
Journal of Physics: Conference Series , Vol. 644, Iss. 1, 2015-10 ,pp. :
Access to resources
Ionization theory in the scanning transmission electron microscope (STEM)
Le Journal de Physique IV, Vol. 09, Iss. PR6, 1999-06 ,pp. :