A methodology for the extraction of quantitative information from electron microscopy images at the atomic level

ISSN： 1742-6596

Source： Journal of Physics: Conference Series , Vol.522, Iss.1, 2014-06, pp. : 68-75

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Quantitative transmission electron microscopy at atomic resolution

Journal of Physics: Conference Series , Vol. 371, Iss. 1, 2012-07 ,pp. : 35-38

IOP Publishing

Access to resources Recommend Favorite

In-situ environmental (scanning) transmission electron microscopy of catalysts at the atomic level

Journal of Physics: Conference Series , Vol. 522, Iss. 1, 2014-06 ,pp. : 14-19

IOP Publishing

Access to resources Recommend Favorite

ANOMALOUS IMAGES IN ELECTRON MICROSCOPY

Le Journal de Physique Colloques, Vol. 27, Iss. C3, 1966-07 ,pp. : C3-178-C3-182

Edp Sciences

Access to resources Recommend Favorite

QUANTITATIVE SCANNING ELECTRON MICROSCOPY OF SURFACES

Le Journal de Physique Colloques, Vol. 45, Iss. C2, 1984-02 ,pp. : C2-291-C2-296

Edp Sciences

Access to resources Recommend Favorite

Wavelet-transform processing of images in atomic force microscopy

By Rekhviashvili S.

Technical Physics Letters, Vol. 28, Iss. 3, 2002-03 ,pp. : 237-238

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite