Publisher: IOP Publishing
ISSN: 1742-6596
Source: Journal of Physics: Conference Series , Vol.558, Iss.1, 2014-12, pp. : 330-337
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
A STRUCTURAL INVESTIGATION OF SOME EVAPORATED SiO
Le Journal de Physique Colloques, Vol. 47, Iss. C8, 1986-12 ,pp. :
High energy electron-beam irradiation effects in Si-SiOx structures
Journal of Physics: Conference Series , Vol. 682, Iss. 1, 2016-02 ,pp. :
ELECTRONIC STRUCTURE OF AMORPHOUS SiO
Le Journal de Physique Colloques, Vol. 42, Iss. C4, 1981-10 ,pp. :
Structural properties of annealed SiOx
Journal of Physics: Conference Series , Vol. 209, Iss. 1, 2010-02 ,pp. :