Sensitive 3-omega measurements on epitaxial thermoelectric thin films

ISSN： 1757-899X

Source： IOP Conference Series: Materials Science and Engineering, Vol.68, Iss.1, 2014-11, pp. : 21-28

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Electrodeposited Iron(III) Oxide (α-Fe₂O₃) Thermoelectric Thin Films

Key Engineering Materials, Vol. 2016, Iss. 701, 2016-08 ,pp. : 23-27

Trans Tech Publications

Access to resources Recommend Favorite

Effect of Lattice Misfit Strain on Crystal System and Ferroelectric Property of BiFeO3 Epitaxial Thin Films

IOP Conference Series: Materials Science and Engineering, Vol. 18, Iss. 9, 2011-10 ,pp. : 270-271

IOP Publishing

Access to resources Recommend Favorite

Growth mode and structural characterization of epitaxial TM/RE thin films

By Pankowski P. Pizzini S. Pelka J.B. Wawro A. Baczewski L.T.

Journal of Alloys and Compounds, Vol. 362, Iss. 1, 2004-01 ,pp. : 56-60

Elsevier

Access to resources Recommend Favorite

Investigation of Structural and Thermoelectric Properties of Lead Telluride Thin Films Deposited by DC Magnetron Sputtering

Key Engineering Materials, Vol. 2016, Iss. 675, 2016-02 ,pp. : 253-256

Trans Tech Publications

Access to resources Recommend Favorite

Epitaxial PZT thin films on YSZ-buffered Si (001) substrates for piezoelectric MEMS or NEMS applications

IOP Conference Series: Materials Science and Engineering, Vol. 41, Iss. 1, 2012-12 ,pp. : 67-70

IOP Publishing

Access to resources Recommend Favorite