Publisher: IOP Publishing
ISSN: 1742-6596
Source: Journal of Physics: Conference Series , Vol.159, Iss.1, 2009-04, pp. : 140-145
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
High-Resolution Electron Microscopy of Nanostructured Materials
Nanoscience & Nanotechnology-Asia, Vol. 1, Iss. 1, 2011-07 ,pp. :
Metals on BN Studied by High Resolution Transmission Electron Microscopy
Journal of Physics: Conference Series , Vol. 371, Iss. 1, 2012-07 ,pp. :
By Serventi A.M. Dolbec R. Khakani M.A.E. Saint-Jacques R.G. Rickerby D.G.
Journal of Physics and Chemistry of Solids, Vol. 64, Iss. 11, 2003-11 ,pp. :
HIGH RESOLUTION ELECTRON MICROSCOPY OF INTERFACES IN CVD β-SiC
Le Journal de Physique Colloques, Vol. 51, Iss. C1, 1990-01 ,pp. :