Site-specific, cross-sectional imaging of biomaterials and the cell/biomaterial interface using focused ion beam/scanning electron microscopy

Publisher： IOP Publishing

ISSN： 1742-6596

Source： Journal of Physics: Conference Series , Vol.126, Iss.1, 2008-08, pp. : 390-393

Access to resources Favorite

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

A New Approach to Studying Biological and Soft Materials Using Focused Ion Beam Scanning Electron Microscopy (FIB SEM)

By  

Journal of Physics: Conference Series , Vol. 26, Iss. 1, 2006-02 ,pp. : 50-53

IOP Publishing

Access to resources Recommend Favorite

Field emission scanning electron microscopy combined with focused ion beam for rubbery material with nano-matrix structure

By  

Journal of Physics: Conference Series , Vol. 184, Iss. 1, 2009-08 ,pp. : 137-140

IOP Publishing

Access to resources Recommend Favorite

A cross-sectional transmission electron microscopy study of iron recovered from a laser-heated diamond anvil cell

By  

Journal of Physics: Conference Series , Vol. 126, Iss. 1, 2008-08 ,pp. : 194-197

IOP Publishing

Access to resources Recommend Favorite

Progress towards site-specific dopant profiling in the scanning electron microscope

By  

Journal of Physics: Conference Series , Vol. 209, Iss. 1, 2010-02 ,pp. : 348-351

IOP Publishing

Access to resources Recommend Favorite

Manipulation of inverted and direct opals by a focused ion beam scanning electron microscope (FIB SEM)

By  

Journal of Physics: Conference Series , Vol. 126, Iss. 1, 2008-08 ,pp. : 242-245

IOP Publishing

Access to resources Recommend Favorite