Publisher: IOP Publishing
ISSN: 1742-6596
Source: Journal of Physics: Conference Series , Vol.209, Iss.1, 2010-02, pp. : 322-325
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Abstract
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Basal-plane stacking faults in non-polar GaN studied by off-axis electron holography
Journal of Physics: Conference Series , Vol. 209, Iss. 1, 2010-02 ,pp. :