Publisher: IOP Publishing
ISSN: 1742-6596
Source: Journal of Physics: Conference Series , Vol.186, Iss.1, 2009-09, pp. : 160-162
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Development of high pressure apparatus for X-ray microtomography at SPring-8
Journal of Physics: Conference Series , Vol. 215, Iss. 1, 2010-03 ,pp. :
High definition X-ray microtomography using a conventionalimpact X-ray source
Le Journal de Physique IV, Vol. 104, Iss. issue, 2003-03 ,pp. :
Mechanical Conversion for High-Throughput TEM Sample Preparation
Journal of Physics: Conference Series , Vol. 26, Iss. 1, 2006-02 ,pp. :