Publisher: IOP Publishing
ISSN: 1742-6596
Source: Journal of Physics: Conference Series , Vol.214, Iss.1, 2010-03, pp. : 418-422
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
APPLICATIONS OF THERMAL-WAVE PHYSICS TO SEMICONDUCTOR MATERIALS ANALYSIS
Le Journal de Physique Colloques, Vol. 44, Iss. C6, 1983-10 ,pp. :
Thermal-wave slice tomography using wave field reconstruction
Le Journal de Physique IV, Vol. 04, Iss. C7, 1994-07 ,pp. :
Measurements of thermal diffusivity of water-alcohol mixtures using a thermal-wave resonator cavity
Le Journal de Physique IV, Vol. 125, Iss. issue, 2005-06 ,pp. :