Spatially resolved XRF, XAFS, XRD, STXM and IR investigation of a natural U-rich clay
Publisher: IOP Publishing
ISSN: 1742-6596
Source: Journal of Physics: Conference Series , Vol.190, Iss.1, 2009-11, pp. : 1027-1033
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract