Growth temperature dependence on local structures of Fe0.05Si0.95 diluted magnetic semiconductors studied by X-ray absorption near-edge structure

Publisher： IOP Publishing

ISSN： 1742-6596

Source： Journal of Physics: Conference Series , Vol.190, Iss.1, 2009-11, pp. : 611-614

Access to resources Favorite

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

The Near Surface Morphology of P3HT:PCBM Blend Films Studied by Near-Edge X-Ray Absorption Fine Structure

By Xue-Song Zeng   Tong-Fei Shi   Chang-Hui Ye   Ning Li   Xin-Hua Li   Yu-Qi Wang  

Chinese Physics Letters, Vol. 31, Iss. 5, 2014-05 ,pp. : 56102-56104

IOP Publishing

Access to resources Recommend Favorite

Correction method for self-absorption effects of fluorescence x-ray absorption near-edge structure on multilayer samples

By Li Wen-bin   Yuan Xiao-feng   Zhu Jing-tao   Zhu Jie   Wang Zhan-shan  

Physica Scripta, Vol. 90, Iss. 1, 2015-01 ,pp. : 15804-15808

IOP Publishing

Access to resources Recommend Favorite

POLARIZED X-RAY ABSORPTION NEAR EDGE STRUCTURE

By  

Le Journal de Physique Colloques, Vol. 47, Iss. C8, 1986-12 ,pp. : C8-1197-C8-1200

Edp Sciences

Access to resources Recommend Favorite

Near-edge X-ray absorption fine structure measurements using a laser plasma XUV source

By  

Journal of Physics: Conference Series , Vol. 186, Iss. 1, 2009-09 ,pp. : 106-108

IOP Publishing

Access to resources Recommend Favorite

X-ray absorption near-edge structure of chromium ions in α-Al2O3

By  

Journal of Physics: Conference Series , Vol. 185, Iss. 1, 2009-09 ,pp. : 226-229

IOP Publishing

Access to resources Recommend Favorite