Quasi-Static Frictional Test between Silicon Sharp Probes with in-situ TEM Observation of Real Contact Point

Publisher: IOP Publishing

ISSN: 1742-6596

Source: Journal of Physics: Conference Series , Vol.258, Iss.1, 2010-11, pp. : 118-123

Access to resources Favorite

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract