Publisher: IOP Publishing
ISSN: 1367-2630
Source: New Journal of Physics, Vol.10, Iss.9, 2008-09, pp. : 75-84
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Properties of SFS heterostructures prepared by a focused-ion-beam technique
Journal of Physics: Conference Series , Vol. 356, Iss. 1, 2012-03 ,pp. :
Focused-ion-beam fabricated charge density wave devices
Le Journal de Physique IV, Vol. 12, Iss. 9, 2002-11 ,pp. :