Publisher: IOP Publishing
ISSN: 1742-6596
Source: Journal of Physics: Conference Series , Vol.303, Iss.1, 2011-07, pp. : 91-98
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
THE LOSS OF MAGNETISM IN U(Fe, Cr)
Le Journal de Physique Colloques, Vol. 49, Iss. C8, 1988-12 ,pp. :
XPS characterization of thin (Al2O3)x(TiO2)1-x films deposited on silicon
Journal of Physics: Conference Series , Vol. 113, Iss. 1, 2008-05 ,pp. :
Uranium compounds prepared by sputter deposition: UFe2+x
Journal of Physics: Conference Series , Vol. 200, Iss. 1, 2010-01 ,pp. :
Characterization of Ce O2 thin films on a sapphire
By Sokolov S.V. Knotko A.V. Putlayev V.I. Kaul A.R.
Superlattices and Microstructures, Vol. 24, Iss. 1, 1998-07 ,pp. :