Publisher: IOP Publishing
ISSN: 1742-6596
Source: Journal of Physics: Conference Series , Vol.286, Iss.1, 2011-03, pp. : 206-211
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
CHARACTERIZATION OF AN AlGaAs/GaAs METAL-SEMICONDUCTOR-METAL PHOTODETECTOR
Le Journal de Physique Colloques, Vol. 49, Iss. C4, 1988-09 ,pp. :
Modeling of a Metal-Ferroelectric-Semiconductor Field-Effect Transistor NAND Gate
By Phillips T.
Ferroelectrics, Vol. 333, Iss. 1, 2006-01 ,pp. :