Publisher： IOP Publishing
ISSN： 1742-6596
Source： Journal of Physics: Conference Series , Vol.371, Iss.1, 2012-07, pp. : 179-182
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Performance of a cold-field emission gun double aberration corrected TEM/STEM at 80kV
Journal of Physics: Conference Series , Vol. 371, Iss. 1, 2012-07 ,pp. :
Access to resources
Recommend
An in-situ TEM study of the effects of 6 keV He ion irradiation on Si and SiO2
Journal of Physics: Conference Series , Vol. 371, Iss. 1, 2012-07 ,pp. :
A T.E.M. in situ study of dislocation glide in InSb (III-V compound)
Revue de Physique Appliquée (Paris), Vol. 23, Iss. 4, 1988-04 ,pp. :
Access to resources