Publisher: IOP Publishing
ISSN: 1742-6596
Source: Journal of Physics: Conference Series , Vol.371, Iss.1, 2012-07, pp. : 91-94
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Scanning Ion Conductance Microscopy for Studying Biological Samples
By Happel Patrick Thatenhorst Denis Dietzel Irmgard D.
Sensors, Vol. 12, Iss. 11, 2012-11 ,pp. :
SIMS AND SCANNING ION MICROSCOPY
Le Journal de Physique Colloques, Vol. 50, Iss. C2, 1989-02 ,pp. :