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IOP Publishing

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HIGH RESOLUTION X-RAY SPECTROSCOPY WITH THE DOUBLE CRYSTAL SPECTROMETER

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Focusing double bent crystal diffractometer in combination with PSD for SANS experiments

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Focusing and reflectivity properties of a parallel double bent crystal (+n,-m) setting

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Analysis of structural defects in boron-implanted silicon single crystals on the basis of the results of double-and triple-crystal x-ray diffractometry

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