Publisher: IOP Publishing
ISSN: 1742-6596
Source: Journal of Physics: Conference Series , Vol.340, Iss.1, 2012-02, pp. : 301-306
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Substructure analysis by means of neutron diffraction
Le Journal de Physique IV, Vol. 03, Iss. C7, 1993-11 ,pp. :
Characterization of ancient Greek coins using non-destructive TOF neutron diffraction
Journal of Physics: Conference Series , Vol. 340, Iss. 1, 2012-02 ,pp. :