X-ray diffraction and electroresistance measurements under high pressure and temperature using a large-volume cell

Publisher: IOP Publishing

ISSN: 1742-6596

Source: Journal of Physics: Conference Series , Vol.121, Iss.4, 2008-07, pp. : 46-50

Access to resources Favorite

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract