New data base for Lα, Lβ, Lγ x-ray production by protons, new empirical fits, extraction of L-subshell ionization cross sections with various atomic parameters, and their comparison with the ECPSSR theory and its modifications: a recommendation for reliable choice of atomic parameters and ionization theory for PIXE analysis

Publisher： IOP Publishing

ISSN： 1742-6596

Source： Journal of Physics: Conference Series , Vol.194, Iss.8, 2009-11, pp. : 8-8

Access to resources Favorite

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Lα, Lβ, and Lγ x-ray production cross sections for heavy elements by electron impact

By  

Journal of Physics: Conference Series , Vol. 194, Iss. 4, 2009-11 ,pp. : 1-1

IOP Publishing

Access to resources Recommend Favorite

Silver L1, L2 and L3 cross-sections for ionization and x-ray production by electron impact

By Sepúlveda A   Bertol A P   Vasconcellos M A Z   Trincavelli J   Hinrichs R   Castellano G  

Journal of Physics B: Atomic, Molecular and Optical Physics, Vol. 47, Iss. 21, 2014-11 ,pp. : 215006-215013

IOP Publishing

Access to resources Recommend Favorite

Measurement of L X-ray production cross sections and L i subshell fluorescence yields

By Kaya A.   Ertugrul M.  

Journal of Electron Spectroscopy and Related Phenomena, Vol. 130, Iss. 1, 2003-07 ,pp. : 111-118

Elsevier

Access to resources Recommend Favorite

Analytical formulas for differential cross sections for ejection of electrons in ionization of water by protons in the PWBA and ECPSSR

By  

Journal of Physics: Conference Series , Vol. 635, Iss. 2, 2015-09 ,pp. : 15-15

IOP Publishing

Access to resources Recommend Favorite

Measurements of absolute L- and M-subshell x-ray production cross sections of Pb by electron impact

By Moy A.   Merlet C.   Llovet X.   Dugne O.  

Journal of Physics B: Atomic, Molecular and Optical Physics, Vol. 46, Iss. 11, 2013-06 ,pp. : 115202-115210

IOP Publishing

Access to resources Recommend Favorite