Publisher： IOP Publishing
ISSN： 1367-2630
Source： New Journal of Physics, Vol.13, Iss.5, 2011-05, pp. : 170-182
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Observation of open quantum dot via low temperature scanning gate microscopy
Journal of Physics: Conference Series , Vol. 150, Iss. 2, 2009-02 ,pp. :
Access to resources
Recommend
Electron paths and double-slit interference in the scanning gate microscopy
New Journal of Physics, Vol. 17, Iss. 6, 2015-06 ,pp. :
Le Journal de Physique IV, Vol. 03, Iss. C7, 1993-11 ,pp. :
Access to resources
Scanning transmission electron microscopy
Le Journal de Physique IV, Vol. 03, Iss. C7, 1993-11 ,pp. :
SIMS AND SCANNING ION MICROSCOPY
Le Journal de Physique Colloques, Vol. 50, Iss. C2, 1989-02 ,pp. :