Metrology and 1/f noise: linear regressions and confidence intervals in flicker noise context

Author: Vernotte F   Lantz E  

Publisher: IOP Publishing

E-ISSN: 1681-7575|52|2|222-237

ISSN: 0026-1394

Source: Metrologia, Vol.52, Iss.2, 2015-04, pp. : 222-237

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Abstract