New approach to metrology in nanotechnology

By Maksimov S.   Maksimov K.  

Technical Physics Letters, Vol. 36, Iss. 10, 2010-10 ,pp. : 938-941

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite

A General Approach to Error Estimation and Optimized Experiment Design, Applied to Multislice Imaging of T 1 in Human Brain at 4.1 T

By Mason G.F.   Chu W.J.   Hetherington H.P.  

Journal of Magnetic Resonance, Vol. 126, Iss. 1, 1997-05 ,pp. : 18-29

Academic Press

Access to resources Recommend Favorite

The implementation of general international guides and standards on regional level in the field of metrology

By  

Journal of Physics: Conference Series , Vol. 238, Iss. 1, 2010-07 ,pp. : 280-285

IOP Publishing

Access to resources Recommend Favorite

A new approach on restoration of dynamic measurement uncertainties in optical precision coordinate metrology

By  

Journal of Physics: Conference Series , Vol. 588, Iss. 1, 2015-02 ,pp. : 139-145

IOP Publishing

Access to resources Recommend Favorite

A general approach to quantum Hall hierarchies

By  

New Journal of Physics, Vol. 13, Iss. 7, 2011-07 ,pp. : 922-938

IOP Publishing

Access to resources Recommend Favorite