Impact of the lateral length scales of dielectric roughness on pentacene organic field-effect transistors

Publisher: IOP Publishing

E-ISSN: 1361-6463|48|10|105103-105111

ISSN: 0022-3727

Source: Journal of Physics D: Applied Physics, Vol.48, Iss.10, 2015-03, pp. : 105103-105111

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Abstract