A compact new-concept ellipsometer for accurate large scale thin film measurements

By Koops Richard   Sonin Petro      

Journal of Optics, Vol. 16, Iss. 6, 2014-06 ,pp. : 65701-65708

IOP Publishing

Access to resources Recommend Favorite

Thin Film Preparation and Characterization Methods

By  

Journal of Magnetohydrodynamics, Plasma, and Space Research, Vol. , Iss. , 2016-01 ,pp. : 58-57

Nova Science Publishers, Inc.

Access to resources Recommend Favorite

Characterization of electrophoretic suspension for thin polymer film deposition

By  

Journal of Physics: Conference Series , Vol. 356, Iss. 1, 2012-03 ,pp. : 172-175

IOP Publishing

Access to resources Recommend Favorite

Opto-Acoustic Method for the Characterization of Thin-Film Adhesion

By Yoshida Sanichiro   Didie David R.   Didie Daniel   Sasaki Tomohiro   Park Hae-Sung   Park Ik-Keun   Gurney David  

Applied Sciences, Vol. 6, Iss. 6, 2016-05 ,pp. : 163-163

MDPI

Access to resources Recommend Favorite

Carbon onions thin film formation and characterization

By Cabioc'h T.   Girard J. C.   Jaouen M.   Denanot M. F.   Hug G.  

EPL (EUROPHYSICS LETTERS), Vol. 38, Iss. 6, 2010-03 ,pp. : 471-476

Edp Sciences

Access to resources Recommend Favorite