Direct Observation of Doping Sites in Temperature‐Controlled, p‐Doped P3HT Thin Films by Conducting Atomic Force Microscopy

Publisher： John Wiley & Sons Inc

E-ISSN： 1521-4095|26|35|6069-6073

ISSN： 0935-9648

Source： ADVANCED MATERIALS, Vol.26, Iss.35, 2014-09, pp. : 6069-6073

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