In situ analysis using synchrotron radiation photoemission spectroscopy for initial oxidation of oxygen preadsorbed Si(001) surfaces induced by supersonic O2 molecular beams

Publisher: John Wiley & Sons Inc

E-ISSN: 1096-9918|47|4|554-554

ISSN: 0142-2421

Source: SURFACE AND INTERFACE ANALYSIS, Vol.47, Iss.4, 2015-04, pp. : 554-554

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