Application of secondary ion mass spectrometer for measuring the diffusion profiles in alkali-halide crystals

Publisher: IOP Publishing

E-ISSN: 1757-899X|81|1|550-553

ISSN: 1757-899X

Source: IOP Conference Series: Materials Science and Engineering, Vol.81, Iss.1, 2015-04, pp. : 550-553

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Abstract