Phase‐field simulation of piezoresponse force microscopy in consideration of different environmental conditions

Publisher: John Wiley & Sons Inc

E-ISSN: 1617-7061|14|1|385-386

ISSN: 1617-7061

Source: PROCEEDINGS IN APPLIED MATHEMATICS & MECHANICS (ELECTRONIC), Vol.14, Iss.1, 2014-12, pp. : 385-386

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Abstract