Strain Profiling of a Ferritic‐Martensitic Stainless Steel Sheet — Comparing Synchrotron with Conventional X‐Ray Diffraction

Publisher： John Wiley & Sons Inc

E-ISSN： 1475-1305|51|1|71-77

ISSN： 0039-2103

Source： STRAIN (ELECTRONIC), Vol.51, Iss.1, 2015-02, pp. : 71-77

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Strain analysis by X-ray diffraction

By Fewster P.F. Andrew N.L.

Thin Solid Films, Vol. 319, Iss. 1, 1998-04 ,pp. : 1-8

Elsevier

Access to resources Recommend Favorite

Investigation of ultra thin Ca/Cd-arachidate films by Grazing Incidence Diffraction (GID) with a conventional X-ray tube and a synchrotron radiation source

By Claudius J. Gerber T. Weigelt J. Kinzler M.

Thin Solid Films, Vol. 287, Iss. 1, 1996-10 ,pp. : 225-231

Elsevier

Access to resources Recommend Favorite

High-pressure synchrotron X-ray powder diffraction studies of zeolites

By Hriljac Joseph A.

Crystallography Reviews, Vol. 12, Iss. 2, 2006-04 ,pp. : 181-193

Taylor & Francis Ltd

Access to resources Recommend Favorite

Energy-dispersive X-ray diffraction beamline at Indus-2 synchrotron source

By PANDEY K

Pramana, Vol. 80, Iss. 4, 2013-04 ,pp. : 607-619

Springer Publishing Company

Access to resources Recommend Favorite

X-ray diffraction study of the sub-structure modification induced by residual stresses during the deposition process of 304L stainless steel films

By Boubeker B. Eymery J.P. Branger V. Goudeau P.

Thin Solid Films, Vol. 275, Iss. 1, 1996-04 ,pp. : 188-190

Elsevier

Access to resources Recommend Favorite