Scanning electron microscopy of superficial defects in Twisted files and Reciproc nickel–titanium files after use in extracted molars

Publisher： John Wiley & Sons Inc

E-ISSN： 1365-2591|48|3|229-235

ISSN： 0143-2885

Source： INTERNATIONAL ENDODONTIC JOURNAL, Vol.48, Iss.3, 2015-03, pp. : 229-235

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