Defect analysis in mission‐critical software systems: a detailed investigation

Publisher: John Wiley & Sons Inc

E-ISSN: 2047-7481|27|1|22-49

ISSN: 2047-7473

Source: JOURNAL OF SOFTWARE: EVOLUTION AND PROCESS (ELECTRONIC), Vol.27, Iss.1, 2015-01, pp. : 22-49

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract