Simulation study of the impact of interface roughness and void inclusions on Cu(In,Ga)(Se,S)2 solar cells

Publisher: John Wiley & Sons Inc

E-ISSN: 1862-6319|212|2|298-306

ISSN: 1862-6300

Source: PHYSICA STATUS SOLIDI (A) APPLICATIONS AND MATERIALS SCIENCE, Vol.212, Iss.2, 2015-02, pp. : 298-306

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Abstract