Long‐Term Follow‐Up in AV Junction Ablation via the SVC in Patients Undergoing Concurrent Device Implantation: A Single Center Experience

Publisher： John Wiley & Sons Inc

E-ISSN： 1540-8159|38|2|254-258

ISSN： 0147-8389

Source： PACING AND CLINICAL ELECTROPHYSIOLOGY, Vol.38, Iss.2, 2015-02, pp. : 254-258

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