Meyer, J. P. (2014). Applied Measurement with jMetrik. New York, NY: Routledge.

Publisher： John Wiley & Sons Inc

E-ISSN： 1745-3984|52|1|121-123

ISSN： 0022-0655

Source： JOURNAL OF EDUCATIONAL MEASUREMENT, Vol.52, Iss.1, 2015-03, pp. : 121-123

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