Peeking into the black box: a trait‐based approach to predicting plant–soil feedback

Publisher: John Wiley & Sons Inc

E-ISSN: 1469-8137|206|1|1-4

ISSN: 0028-646x

Source: NEW PHYTOLOGIST (ELECTRONIC), Vol.206, Iss.1, 2015-04, pp. : 1-4

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Abstract