Optimization of clamped beam geometry for fracture toughness testing of micron-scale samples

Author： Jaya B. Nagamani   Bhowmick Sanjit   Asif S.A. Syed   Warren Oden L.   Jayaram Vikram  

Publisher： Taylor & Francis Ltd

E-ISSN： 1478-6443|95|16-18|1945-1966

ISSN： 1478-6443

Source： Philosophical Magazine, Vol.95, Iss.16-18, 2015-06, pp. : 1945-1966

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